New article: Single-Event Burnout (SEB)

May 14, 2026 | work progress

New publication of the SAFEPOWER EU Project consortium!
The article, published by Electronics MDPI is focusing on ๐—ฆ๐—ถ๐—ป๐—ด๐—น๐—ฒ-๐—˜๐˜ƒ๐—ฒ๐—ป๐˜ ๐—•๐˜‚๐—ฟ๐—ป๐—ผ๐˜‚๐˜ (SEB), which is one of t๐—ต๐—ฒ ๐—บ๐—ผ๐˜€๐˜ ๐—ฐ๐—ฟ๐—ถ๐˜๐—ถ๐—ฐ๐—ฎ๐—น ๐—ณ๐—ฎ๐—ถ๐—น๐˜‚๐—ฟ๐—ฒ ๐—บ๐—ฒ๐—ฐ๐—ต๐—ฎ๐—ป๐—ถ๐˜€๐—บ๐˜€ ๐—ถ๐—ป ๐˜€๐—ถ๐—น๐—ถ๐—ฐ๐—ผ๐—ป ๐—ฝ๐—ผ๐˜„๐—ฒ๐—ฟ ๐— ๐—ข๐—ฆ๐—™๐—˜๐—ง๐˜€ operating in radiation environments.
This publication was elaborated by researchers from the Institute of Microelectronics of Barcelona (IMB-CNM, CSIC) and Power Electronics.

The article is available in Open Access: https://www.mdpi.com/2079-9292/15/6/1201

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