Die-Level Electrothermal Characterization of Power Devices for Robustness and EMC Analysis
On the 17 November 2025, Xavier Perpiñà from the Institute of Microelectronics of Barcelona (IMB-CNM-CSIC) had the honour of delivering an invited talk that opened the 8th edition of the Electromagnetic Compatibility Conference (#EMC) an event hosted by the ITA – Instituto Tecnológico de Aragón and, for the first time, held jointly between Spain and Portugal.
➡️His presentation, titled
“Die-Level Electrothermal Characterization of Power Devices for Robustness and EMC Analysis,”
introduced key insights from his research and showcased recent advancements within the SAFEPOWER EU Project, particularly the progress on the Internal InfraRed Laser Deflection (IIR-LD) technique.
➡️For context, #EMC (Electromagnetic Compatibility) is essential to ensure that electronic devices operate safely and without interference.
🔍 This event was an excellent opportunity to present our latest progress and to connect with professionals dedicated to innovation in power electronics, reliability, and electromagnetic compatibility.
